Parameter viewing, fast and clear.

Advancing bold discoveries has never been so easy. The 4200A-SCS parameter analyzer reduces the time from setup to running calibration tests by up to 50%, achieving unparalleled measurement and analysis capabilities. In addition, embedded measurement expertise provides unparalleled testing guidance and keeps you informed about the final results.

characteristic

• Advanced measurement hardware for DC IV, CV, and pulse IV measurement types
• Start testing the hundreds of user modifiable applications included in Clarius software immediately
• Automatic real-time parameter extraction, data plotting, and analysis functions

Accurate C-V characterization

Use Jishili's latest capacitor voltage unit (CVU) 4215-CVU to measure the one digit flying method. By integrating a 1 V AC power supply into Geely's industry-leading CVU architecture, the 4215-CVU can perform low-noise capacitance measurements at frequencies ranging from 1 kHz to 10 MHz.

characteristic

• The first CV meter in its class capable of driving 1 V AC power supply voltage
• 1 kHz frequency, resolution ranging from 1 kHz to 10 MHz
• Measure capacitance, conductivity, and admittance
• Up to four channels can be measured using the 4200A-CVIV multi way switch

Measurement of Femtofarad (1e-15F) capacitance using 4215-CVU

Measure, switch, repeat.

The 4200A-CVIV multi-channel switching module automatically switches between I-V and C-V measurements without the need for rewiring or lifting the probe end. Unlike competing products, the four channel 4200A-CVIV display provides local visual viewing, allowing for quick completion of test settings and easy troubleshooting in case of unexpected results.

characteristic

• C-V measurement can be moved to any device terminal without rewiring
• Users can configure low current function
• Personalized output channel name
• View real-time testing status

Stable low current measurement, suitable for I-V verification

By using the 4201-SMU and 4211-SMU modules, you can achieve stable low current measurement in high capacitance systems. The 4200A-SCS has four models of Source Measurement Units (SMUs) to choose from, which can be customized to meet all your I-V measurement needs. By providing on-site installable units and optional preamplifier modules, Keithley ensures that you obtain the most accurate low current measurements with minimal or no downtime.

characteristic

• You don't need to send the instrument back to the factory to increase SMU
• Conduct flight safety measurements
• Up to 9 SMU channels
• Optimized for long cables or large reels

Integrated solution with analytical detector and low-temperature controller

The 4200A-SCS parameter analyzer supports many manual and semi-automatic chip detectors and low-temperature controllers, including MPI、Cascade MicroTech、Lucas Labs/Signatone、MicroManipulator、Wentworth Laboratories、LakeShore Model 336 Low temperature controller.

characteristic

• Click to test sequencing
• Manual "detector mode test detector function
• Fake detector mode can be debugged without removing commands

Reduce costs and protect your investment

The Jishili Guarantee Plan provides fast and high-quality services at a small cost of on-demand service events. Simply click or make a phone call to receive repair services, without the need for quoting or filling out purchase orders, and without any approval delays.

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Biosensor calibration

Biosensors or bioFETs convert the biological response of analytes into electrical signals. The Clarius software integrated into the 4200A-SCS includes a project for testing bioFET. Starting from this point, verify the transmission and output characteristics of the biosensor, and start working from here.

Flying capacitance measurement

Measure the sub femtosecond Farad capacitance using the 4215-CVU module. By driving 1 V AC, the noise level of 4215-CVU can be as low as 6 attofarad when measuring 1 fF capacitor. This is just one of the dozens of applications that come with Clarius software for measuring capacitance and extracting important parameters.

Measurement of Femtofarad (1e-15F) capacitance using 4215-CVU

Perform optimal capacitance and AC impedance measurements

characteristic

• Built in flight measurement function
• 10000 frequency steps from 1kHz to 10MHz
• Customize any testing for any device using the user library

Reliability of Semiconductor and NVM

Utilizing new technology in testing through comprehensive pulse I-V verification. The 4200A-SCS provides support and ready to use testing for the latest NVRAM technology, ranging from floating gate circuit flash to ReRAM and FeRAM. The dual source current and voltage measurement function supports both transient and I-V domain calibration.

Evaluate the thermal carrier induced degradation of MOSFET devices

Single nanosecond pulse solution for non-volatile memory testing

Non volatile memory technology pulse I-V verification

Provide C-V measurement function suitable for high impedance applications

Using Keithley's custom ultra-low frequency C-V technique to analyze the capacitance of high resistance samples. This technology can be applied by using only source measurement unit (SMU) instruments, and can also be combined with 4210-CVU to perform higher frequency measurements.

The 4200A-SCS parameter analyzer can perform extremely low frequency capacitance voltage measurements on high impedance devices

Tips and techniques for simplifying MOSFET/MOSCAP device calibration

characteristic

• 0.01~10 Hz frequency range, 1 pF~10 nF sensitivity
• 3 1/2 bit typical resolution, minimum typical value of 10 fF

Testing when using long cables or capacitive fixtures

When testing requires very long cables or fixtures with high capacitance, please use 4201 or 4211-SMU. These SMUs are highly suitable for connecting LCD testing stations, detectors, switch matrices, or any other large or complex testing equipment. The on-site installable version allows you to increase capacity without returning the device to the service center.

Use 4201-SMU and 4211-SMU to perform stable low current measurements through high test connection capacitors

Material resistivity

By using the 4200A-SCS integrated with SMU, resistivity can be easily measured using a four point coaxial probe or the van der Waals method. The built-in test can automatically repeat Vanderbilt calculations, saving you valuable research time. A maximum current resolution of 10aA and an input impedance greater than 10-16 ohms can provide more accurate and precise results.

The 4200A-SCS parameter analyzer and four point coaxial probe can be used to perform resistivity measurements of semiconductor materials

The 4200A-SCS parameter analyzer can be used to perform van der Waals and Hall voltage measurements

MOSFET verification

The 4200A-SCS can accommodate all necessary instruments for performing comprehensive MOS equipment calibration through component or wafer testing. Internal testing and projects can address issues such as oxide thickness, threshold voltage, doping concentration, and mobile ion concentration in MOSCap. Just touch a button in the instrument box to run all these tests.

The 4200A-SCS parameter analyzer can be used to perform MOS capacitor C-V calibration

Automation control from laboratory to wafer fab

Keithley Automated Calibration Kit (ACS) can fully control your equipment. Whether you need to control several instruments on a workbench or automate the entire testing rack for production, ACS can provide a flexible interactive environment for equipment calibration, parameter testing, reliability testing, and simple functional testing.

• Perform simple one-time tests or build complex project trees
• Using Python to write code in ACS for unlimited flexibility and control
• Manual or automatic wafer detector control
• Data management and statistical analysis functions

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Clarius+Analysis Suite

With the Clarius+software suite, you can easily gain insights into material and equipment calibration. Clarius runs locally on the 4200A-SCS and can plan, configure, and analyze test results. In addition, Clarius can be installed on any Windows 10 PC to plan and configure testing before running it in the laboratory, or to analyze data after collecting it.

• Over 200 pre configured tests to accelerate laboratory operations
• Carefully collected real data by Keithley engineers
• Built in contextual help and application guide
• Provide monitoring mode for real-time viewing of results

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